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[IEEE 2015 7th International Conference of Soft Computing and Pattern Recognition (SoCPaR) - Fukuoka, Japan (2015.11.13-2015.11.15)] 2015 7th International Conference of Soft Computing and Pattern Recognition (SoCPaR) - Automated surface defect inspection system for capacitive touch sensor
Chiang, Yu-Min, Lin, Yih-Lon, Chien, Wei-HongYear:
2015
Language:
english
DOI:
10.1109/socpar.2015.7492820
File:
PDF, 576 KB
english, 2015