[IEEE 2016 Annual IEEE Systems Conference (SysCon) -...

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[IEEE 2016 Annual IEEE Systems Conference (SysCon) - Orlando, FL, USA (2016.4.18-2016.4.21)] 2016 Annual IEEE Systems Conference (SysCon) - Requirement analysis of inspection equipment for integrative mechatronic product and production system development: Model-based systems engineering approach

Lukei, Meinolf, Hassan, Bassem, Dumitrescu, Roman, Sigges, Thorsten, Derksen, Viktor
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Year:
2016
Language:
english
DOI:
10.1109/syscon.2016.7490661
File:
PDF, 598 KB
english, 2016
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