![](/img/cover-not-exists.png)
[IEEE 2016 Annual IEEE Systems Conference (SysCon) - Orlando, FL, USA (2016.4.18-2016.4.21)] 2016 Annual IEEE Systems Conference (SysCon) - Requirement analysis of inspection equipment for integrative mechatronic product and production system development: Model-based systems engineering approach
Lukei, Meinolf, Hassan, Bassem, Dumitrescu, Roman, Sigges, Thorsten, Derksen, ViktorYear:
2016
Language:
english
DOI:
10.1109/syscon.2016.7490661
File:
PDF, 598 KB
english, 2016