The Energy-Driven Hot Carrier Degradation Modes of nMOSFETs

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IEEE Transactions on Device and Materials Reliability 2009

The Energy-Driven Hot Carrier Degradation Modes of nMOSFETs

Guerin, C., Huard, V., Bravaix, A.
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Year:
2009
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2007.898084
File:
PDF, 644 KB
english, 2009
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