Improving the reliability of heuristic multiple fault...

Applied Intelligence 1992 / 07 Vol. 2; Iss. 1

Improving the reliability of heuristic multiple fault diagnosis via the EC-based Genetic Algorithm

Walter D. Potter, John A. Miller, Bruce E. Tonn, Ravi V. Gandham, Chito N. Lapena
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Volume:
2
Language:
english
Pages:
19
DOI:
10.1007/bf00058573
Date:
July, 1992
File:
PDF, 1.59 MB
english, 1992
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