[IEEE 2016 IEEE 34th VLSI Test Symposium (VTS) - Las Vegas, NV (2016.4.25-2016.4.27)] 2016 IEEE 34th VLSI Test Symposium (VTS) - WeSPer: A flexible small delay defect quality metric
Hasib, Omar Al-Terkawi, Savaria, Yvon, Thibeault, ClaudeYear:
2016
Language:
english
DOI:
10.1109/vts.2016.7477266
File:
PDF, 260 KB
english, 2016