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[IEEE 2016 IEEE 34th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2016.4.25-2016.4.27)] 2016 IEEE 34th VLSI Test Symposium (VTS) - Code-modulated embedded test for phased arrays
Greene, Kevin, Chauhan, Vikas, Floyd, BrianYear:
2016
Language:
english
DOI:
10.1109/vts.2016.7477274
File:
PDF, 1.09 MB
english, 2016