SPIE Proceedings [SPIE Aerospace Sensing - Orlando, FL (Monday 20 April 1992)] Infrared Focal Plane Array Producibility and Related Materials - 80-kelvin automated wafer testing of a 64x64-pixel-readout integratedcircuit
Wittwer, Timothy Y., Chester, Daniel M., Gonzales, John, Balcerak, Raymond S., Pellegrini, Paul W., Scribner, Dean A.Volume:
1683
Year:
1992
Language:
english
DOI:
10.1117/12.137776
File:
PDF, 1.19 MB
english, 1992