SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 31 January 1993)] Machine Vision Applications in Industrial Inspection - Color analysis of defects for automated visual inspection of pine wood
Marszalec, Elzbieta A., Pietikaeinen, Matti, Wu, Frederick Y., Dawson, Benjamin M.Volume:
1907
Year:
1993
Language:
english
DOI:
10.1117/12.144817
File:
PDF, 878 KB
english, 1993