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SPIE Proceedings [SPIE Thin Film Physics and Applications: Second International Conference - Shanghai, China (Friday 15 April 1994)] Second International Conference on Thin Film Physics and Applications - Photoluminescence studies of carbon- and oxygen-related radiation damage point defects in crystalline silicon
Kwok, T. K., Zhou, Shixun, Wang, Yongling, Chen, Yi-Xin, Mao, ShuzhengVolume:
2364
Year:
1994
Language:
english
DOI:
10.1117/12.190745
File:
PDF, 485 KB
english, 1994