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SPIE Proceedings [SPIE Thin Film Physics and Applications: Second International Conference - Shanghai, China (Friday 15 April 1994)] Second International Conference on Thin Film Physics and Applications - Application of frustrated total reflection
Heavens, Oliver S., Zhou, Shixun, Wang, Yongling, Chen, Yi-Xin, Mao, ShuzhengVolume:
2364
Year:
1994
Language:
english
DOI:
10.1117/12.190746
File:
PDF, 221 KB
english, 1994