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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, USA (Saturday 2 February 2013)] Integrated Optics: Devices, Materials, and Technologies XVII - Impact of thermal oxidation, surface chemistry and porous silicon morphology for sensing applications
Kolmychek, I. A., Kopylov, D. A., Murzina, T. V., Baldini, F., Berneschi, S., Farnesi, D., Giannetti, A., Tombelli, S., Nunzi Conti, G., Soria, S., Broquin, Jean Emmanuel, Nunzi Conti, GualtieroVolume:
8627
Year:
2013
Language:
english
DOI:
10.1117/12.2007377
File:
PDF, 337 KB
english, 2013