SPIE Proceedings [SPIE International Symposium on Precision Engineering Measurement and Instrumentation 2012 - Chengdu, China (Wednesday 8 August 2012)] Eighth International Symposium on Precision Engineering Measurement and Instrumentation - Weak feature extraction of gear fault based on stochastic resonance denoising
Zhao, Jun, Lai, Xin-huan, Kong, Ming, Guo, Tian-tai, Lin, JieVolume:
8759
Year:
2013
Language:
english
DOI:
10.1117/12.2015034
File:
PDF, 686 KB
english, 2013