SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California, United States (Tuesday 16 September 2014)] Photomask Technology 2014 - Photonic curvilinear data processing
Ackmann, Paul W., Hayashi, Naoya, Browning, Clyde, Quaglio, Thomas, Figueiro, Thiago, Pauliac, Sébastien, Belledent, Jérôme, Fay, Aurélien, Bustos, Jessy, Marusic, Jean-Christophe, Schiavone, PatrickVolume:
9235
Year:
2014
Language:
english
DOI:
10.1117/12.2069335
File:
PDF, 585 KB
english, 2014