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SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - Experimental study for the influence of surface characteristics on the fringe patterns
Han, Sen, Yoshizawa, Toru, Zhang, Song, Wei, Yifan, Xi, Jiangtao, Yu, Yanguang, Guo, Qinghua, Yin, YongkaiVolume:
9276
Year:
2014
Language:
english
DOI:
10.1117/12.2071295
File:
PDF, 454 KB
english, 2014