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SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - Compact camera for 3D position registration of cancer in radiation treatment
Han, Sen, Yoshizawa, Toru, Zhang, Song, Wakayama, Toshitaka, Hiratsuka, Shun, Kamakura, Yoshihisa, Nakamura, Katsumasa, Yoshizawa, ToruVolume:
9276
Year:
2014
Language:
english
DOI:
10.1117/12.2072170
File:
PDF, 3.15 MB
english, 2014