SPIE Proceedings [SPIE International Conferences on Optical Fabrication and Testing and Applications of Optical Holography - Tokyo, Japan (Monday 5 June 1995)] International Conference on Optical Fabrication and Testing - Technique of recording and judging the sign of tilt in one interferogram
Tenjimbayashi, Koji, Kasai, ToshioVolume:
2576
Year:
1995
Language:
english
DOI:
10.1117/12.215594
File:
PDF, 668 KB
english, 1995