SPIE Proceedings [SPIE Polarimetry '90, Huntsville, AL - Huntsville, AL (Monday 14 May 1990)] Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray - Ultraviolet polarimeter for characterization of an imaging spectrometer
Morgan, M. F., Chipman, Russell A., Torr, Douglas G., Chipman, Russell A., Morris, John W.Volume:
1317
Year:
1990
Language:
english
DOI:
10.1117/12.22074
File:
PDF, 504 KB
english, 1990