SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - New method and calculation program to determine life-time of inhomogeneously broadened transitions
Rozuvan, Stanislav G., Rozuvan, K. P., Shaykevich, Igor A., Tikhonov, Eugene A., Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
2648
Year:
1995
Language:
english
DOI:
10.1117/12.226184
File:
PDF, 74 KB
english, 1995