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SPIE Proceedings [SPIE Photonics East '95 - Philadelphia, PA (Sunday 22 October 1995)] Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology - Optical system of an industrial 3D laser scanner for solder paste inspection
Horijon, Jef L., van Amstel, Willem D., Couweleers, Fred C. M., Ligthart, Wilco C., Descour, Michael R., Harding, Kevin G., Svetkoff, Donald J.Volume:
2599
Year:
1996
Language:
english
DOI:
10.1117/12.230375
File:
PDF, 635 KB
english, 1996