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SPIE Proceedings [SPIE International Liquid Crystal Workshop: Surface Phenomena - St. Petersburg, Russia (Wednesday 21 June 1995)] International Liquid Crystal Workshop on Surface Phenomena - Scanning probe microscope study of obliquely evaporated SiOx and its indium-tin-oxide underlayer for the alignment of ferroelectric liquid crystals
Bodammer, Georg K., Gourlay, James D., Vass, David G., Hossack, William J., Rumtsev, Evgenij, Tomilin, Maxim G.Volume:
2731
Year:
1996
Language:
english
DOI:
10.1117/12.230643
File:
PDF, 374 KB
english, 1996