SPIE Proceedings [SPIE Electronic Imaging: Science & Technology - San Jose, CA (Sunday 28 January 1996)] Optical Security and Counterfeit Deterrence Techniques - Perceptual information from OVD diffraction security devices
Moser, Jean-Frederic, Staub, Rene, Tompkin, Wayne R., van Renesse, Rudolf L.Volume:
2659
Year:
1996
Language:
english
DOI:
10.1117/12.235473
File:
PDF, 300 KB
english, 1996