SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Optical Inspection and Micromeasurements - Integrated structural evaluation: combining ultrasonics and optics
Culshaw, Brian, Pierce, S. Gareth, Philp, Wayne R., Michie, W. Craig, Gorecki, ChristopheVolume:
2782
Year:
1996
DOI:
10.1117/12.250736
File:
PDF, 546 KB
1996