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SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Grazing Incidence and Multilayer X-Ray Optical Systems - High-speed imager AXAF calibration microchannel plate detector
Evans, Ian N., Kellogg, Edwin M., McDermott, Walter C., Ordway, Mark P., Rosenberg, J. M., Wargelin, Bradford J., Hoover, Richard B., Walker II, Arthur B. C.Volume:
3113
Year:
1997
Language:
english
DOI:
10.1117/12.278848
File:
PDF, 529 KB
english, 1997