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SPIE Proceedings [SPIE Lasers and Optics in Manufacturing III - Munich, Germany (Monday 16 June 1997)] Optical Inspection and Micromeasurements II - Condition and control monitoring of structures using an in-situ fiber optic system
Jamieson, M., Hytiris, N., Hepher, Mike J., El Sharif, M., Gorecki, ChristopheVolume:
3098
Year:
1997
Language:
english
DOI:
10.1117/12.281179
File:
PDF, 209 KB
english, 1997