![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Intelligent Systems & Advanced Manufacturing - Pittsburgh, PA (Tuesday 14 October 1997)] Machine Vision Applications, Architectures, and Systems Integration VI - New design environment for defect detection in web inspection systems
Hajimowlana, S. Hossain, Muscedere, Roberto, Jullien, Graham A., Roberts, James W., Solomon, Susan S., Batchelor, Bruce G., Miller, John W. V.Volume:
3205
Year:
1997
Language:
english
DOI:
10.1117/12.285567
File:
PDF, 2.02 MB
english, 1997