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SPIE Proceedings [SPIE Lasers and Optics in Manufacturing III - Munich, Germany (Monday 16 June 1997)] Sensors, Sensor Systems, and Sensor Data Processing - New results in calculating the unambiguous phase for SAR interferometry
Kraemer, Rainer, Loffeld, Otmar, Loffeld, OtmarVolume:
3100
Year:
1997
Language:
english
DOI:
10.1117/12.287743
File:
PDF, 1.45 MB
english, 1997