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SPIE Proceedings [SPIE Photonics China '98 - Beijing, China (Wednesday 16 September 1998)] Automated Optical Inspection for Industry: Theory, Technology, and Applications II - New kind of spectral analysis instrument for measuring time-resolved spectrum of single-pulse light
Yang, Jingguo, Yang, Cangli, Ha, Yuanqian, Chen, Xiaobo, Jin, Lihong, Tan, Hua, Hu, Shaolou, Wang, Xiang, Peng, Qixian, Ye, ShenghuaVolume:
3558
Year:
1998
Language:
english
DOI:
10.1117/12.318453
File:
PDF, 1.02 MB
english, 1998