SPIE Proceedings [SPIE International Conference on Applied Optical Metrology - Balatonfured, Hungary (Monday 8 June 1998)] International Conference on Applied Optical Metrology - Adaptive system for speckle pattern interferometry
Kornis, Janos, Nemeth, Attila, Moustafa, Nasser, Rastogi, Pramod K., Gyimesi, FerencVolume:
3407
Year:
1998
Language:
english
DOI:
10.1117/12.323323
File:
PDF, 2.31 MB
english, 1998