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SPIE Proceedings [SPIE AeroSense '99 - Orlando, FL (Monday 5 April 1999)] Optical Pattern Recognition X - Optical recognizer based on FLC over silicon technology
Wilkinson, Tim D., Crossland, William A., Casasent, David P., Chao, Tien-HsinVolume:
3715
Year:
1999
Language:
english
DOI:
10.1117/12.341293
File:
PDF, 2.27 MB
english, 1999