SPIE Proceedings [SPIE Optoelectronics '99 - Integrated Optoelectronic Devices - San Jose, CA (Saturday 23 January 1999)] Photodetectors: Materials and Devices IV - Characterization of self-assembled InGaAs/InGaP quantum dot mid-infrared photoconductive detectors grown by low-pressure MOCVD
Kim, Seong S., Erdtmann, Matthew, Razeghi, Manijeh, Brown, Gail J., Razeghi, ManijehVolume:
3629
Year:
1999
Language:
english
DOI:
10.1117/12.344572
File:
PDF, 1.27 MB
english, 1999