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SPIE Proceedings [SPIE Material Science and Material Properties for Infrared Optoelectronics - Kiev, Ukraine (Monday 28 September 1998)] Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics - Characterization of diffusion length of minority carriers in (CdZn)Te at temperatures of 80 to 300 K
Franc, Jan, Belas, Eduard, Hlidek, Pavel, Toth, A. L., Sitter, Helmut, Grill, Roman, Hoeschl, Pavel, Moravec, Pavel, Sizov, Fiodor F.Volume:
3890
Year:
1999
Language:
english
DOI:
10.1117/12.368349
File:
PDF, 293 KB
english, 1999