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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Optical Manufacturing and Testing III - Absolute measurement of surface profiles with phase-shifting projected fringe profilometry
Liu, Hongyu, Bard, Benjamin A., Lu, Guowen, Wu, Shudong, Stahl, H. PhilipVolume:
3782
Year:
1999
Language:
english
DOI:
10.1117/12.369194
File:
PDF, 225 KB
english, 1999