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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III - Characterization of silicon photodiode detectors with multilayer filter coatings for 17 to 150 A
Seely, John F., Korde, Raj S., Hanser, Frederick A., Wise, J., Holland, Glenn E., Weaver, James L., Rife, Jack C., Fineschi, Silvano, Woodgate, Bruce E., Kimble, Randy A.Volume:
3764
Year:
1999
Language:
english
DOI:
10.1117/12.371077
File:
PDF, 238 KB
english, 1999