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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] EUV, X-Ray, and Neutron Optics and Sources - Matching bent crystals to high-brilliance sources

Popovici, Mihai, Stoica, Alexandru D., MacDonald, Carolyn A., Goldberg, Kenneth A., Maldonado, Juan R., Chen-Mayer, Huaiyu H., Vernon, Stephen P.
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Volume:
3767
Year:
1999
Language:
english
DOI:
10.1117/12.371138
File:
PDF, 340 KB
english, 1999
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