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SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Visual Data Exploration and Analysis VII - Topology-based methods for quantitative comparisons of vector fields

Batra, Rajesh, Kling, Kerstin, Hesselink, Lambertus, Erbacher, Robert F., Chen, Philip C., Roberts, Jonathan C., Wittenbrink, Craig M.
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Volume:
3960
Year:
2000
Language:
english
DOI:
10.1117/12.378904
File:
PDF, 785 KB
english, 2000
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