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SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - Unambiguous interferometric surface profilometry using liquid crystal modulators
Begbie, Mark L., Lesso, John P., Sibbett, Wilson, Padgett, Miles J., Tobin, Jr., Kenneth W.Volume:
3966
Year:
2000
Language:
english
DOI:
10.1117/12.380094
File:
PDF, 1.02 MB
english, 2000