SPIE Proceedings [SPIE Optics and Optoelectronic Inspection...

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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Advanced Photonic Sensors: Technology and Applications - Sampling correct technology of a distributed optical fiber temperature sensor (DOFTS) system

Zhang, Zaixuan, Wang, Jianfeng, Feng, Haiqi, Guo, Ning, Yu, Xiangdong, Wu, Xiaobiao, Kim, Insoo S., Kim, Yohee, Tang, Jinfa, Xu, Chao-Nan, Li, Haizhang
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Volume:
4220
Year:
2000
Language:
english
DOI:
10.1117/12.401726
File:
PDF, 343 KB
english, 2000
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