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SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Intelligent Robots and Computer Vision XIX: Algorithms, Techniques, and Active Vision - Automatic alignment of electron tomography images using markers
Brandt, Sami S., Heikkonen, Jukka, Casasent, David P.Volume:
4197
Year:
2000
Language:
english
DOI:
10.1117/12.403773
File:
PDF, 442 KB
english, 2000