SPIE Proceedings [SPIE Lightmetry - Pultusk, Poland (Monday 5 June 2000)] Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light - Colorimetric evaluation of the spot center during the optical design of microscope objectives
Kryszczynski, Tadeusz, Pluta, MaksymilianVolume:
4517
Year:
2001
Language:
english
DOI:
10.1117/12.435978
File:
PDF, 238 KB
english, 2001