SPIE Proceedings [SPIE Lightmetry - Pultusk, Poland (Monday...

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SPIE Proceedings [SPIE Lightmetry - Pultusk, Poland (Monday 5 June 2000)] Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light - Colorimetric evaluation of the spot center during the optical design of microscope objectives

Kryszczynski, Tadeusz, Pluta, Maksymilian
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Volume:
4517
Year:
2001
Language:
english
DOI:
10.1117/12.435978
File:
PDF, 238 KB
english, 2001
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