SPIE Proceedings [SPIE Photomask and Next Generation...

  • Main
  • SPIE Proceedings [SPIE Photomask and...

SPIE Proceedings [SPIE Photomask and Next Generation Lithography Mask Technology VIII - Kanagawa, Japan (Wednesday 25 April 2001)] Photomask and Next-Generation Lithography Mask Technology VIII - Resolution improvement of chemical-amplification resist using process-induced effect correction

Choi, Ji-Hyeon, Kim, Chang-Hwan, Lee, Jeong-Yun, Moon, Seong-Yong, Choi, Seong-Woon, Han, Woo-Sung, Sohn, Jung-Min, Kawahira, Hiroichi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
4409
Year:
2001
Language:
english
DOI:
10.1117/12.438359
File:
PDF, 278 KB
english, 2001
Conversion to is in progress
Conversion to is failed