SPIE Proceedings [SPIE Laser Metrology for Precision Management and Inspection in Industry - Florianopolis, Brazil (Thursday 22 February 2001)] Laser Metrology for Precision Measurement and Inspection in Industry - New strategic challenges for instrumentation in precision laser metrology for industry
Chour, Matthias, Mueller, Jochen, Hofmann, Dietrich, Albertazzi, Jr., ArmandoVolume:
4420
Year:
2001
Language:
english
DOI:
10.1117/12.439199
File:
PDF, 490 KB
english, 2001