SPIE Proceedings [SPIE Laser Metrology for Precision Management and Inspection in Industry - Florianopolis, Brazil (Thursday 22 February 2001)] Laser Metrology for Precision Measurement and Inspection in Industry - Noninvasive microtomographic inspection of rough surfaces by active triangulation
Costa, Manuel F. M., Albertazzi, Jr., ArmandoVolume:
4420
Year:
2001
Language:
english
DOI:
10.1117/12.439209
File:
PDF, 1.23 MB
english, 2001