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SPIE Proceedings [SPIE Micro - DL tentative - San Jose, CA (Friday 1 March 1991)] Integrated Circuit Metrology, Inspection, and Process Control V - Automated approach to the correlation of defect locations to electrical test results to determine yield reducing defects
Slama, M. M., Patterson, Angela C., Arnold, William H.Volume:
1464
Year:
1991
Language:
english
DOI:
10.1117/12.44471
File:
PDF, 303 KB
english, 1991