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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Polarization Measurement, Analysis, and Applications V - Automated registration of polarimetric imagery using Fourier transform techniques
Persons, Christopher M., Chenault, David B., Jones, Michael W., Spradley, Kevin D., Gulley, Michael G., Farlow, Craig A., Goldstein, Dennis H., Chenault, David B.Volume:
4819
Year:
2002
Language:
english
DOI:
10.1117/12.450935
File:
PDF, 282 KB
english, 2002