SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Developments in X-Ray Tomography III - Analytical simulator for Compton tomographic measurements
Brunetti, Antonio, Golosio, Bruno, Cesareo, Roberto, Borlino, Cesare C., Bonse, UlrichVolume:
4503
Year:
2002
Language:
english
DOI:
10.1117/12.452860
File:
PDF, 145 KB
english, 2002