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SPIE Proceedings [SPIE Optomechatronic Systems III - Stuttgart, Germany (Tuesday 12 November 2002)] Optomechatronic Systems III - Effect of noise level for estimating the spatial uncertainties of work object localization
Sallinen, Mikko, Heikkila, Tapio A., Yoshizawa, ToruVolume:
4902
Year:
2002
Language:
english
DOI:
10.1117/12.469920
File:
PDF, 71 KB
english, 2002