SPIE Proceedings [SPIE Electronic Imaging 2003 - Santa...

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SPIE Proceedings [SPIE Electronic Imaging 2003 - Santa Clara, CA (Monday 20 January 2003)] Color Imaging VIII: Processing, Hardcopy, and Applications - Improved Vector Error Diffusion for Reduction of Smear Artifact in the Boundary Regions

Lee, Soon-Chang, Kim, Yun-Tae, Cho, Yang-Ho, Ha, Yeong-Ho, Eschbach, Reiner, Marcu, Gabriel G.
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Volume:
5008
Year:
2003
Language:
english
DOI:
10.1117/12.472029
File:
PDF, 108 KB
english, 2003
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