SPIE Proceedings [SPIE Electronic Imaging 2003 - Santa...

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SPIE Proceedings [SPIE Electronic Imaging 2003 - Santa Clara, CA (Monday 20 January 2003)] Image Processing: Algorithms and Systems II - A general approach for multifeature multisensor classification and localization of 3D objects in 2D image sequences

Koelzow, Thorsten, Ellenrieder, Marc M., Dougherty, Edward R., Astola, Jaakko T., Egiazarian, Karen O.
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Volume:
5014
Year:
2003
Language:
english
DOI:
10.1117/12.477727
File:
PDF, 630 KB
english, 2003
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