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SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Progress with the implementation of a shearography system for the testing of technical components
Osten, Wolfgang, Baumbach, Torsten, Falldorf, Claas, Kalms, Michael K., Jueptner, Werner P. O., Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. HerbertVolume:
4900
Year:
2002
Language:
english
DOI:
10.1117/12.484540
File:
PDF, 2.00 MB
english, 2002