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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Statistical processing of straight equispaced fringe patterns using the discrete Fourier analysis
Nascov, Victor, Osten, Wolfgang, Kujawinska, Malgorzata, Dobroiu, Adrian, Apostol, Dan, Creath, Katherine, Damian, VictorVolume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.500559
File:
PDF, 433 KB
english, 2003